Used KIC THERMAL SlimKIC 2000 #9276994 for sale

ID: 9276994
Thermal profiler.
KIC THERMAL SlimKIC 2000 is a wafer testing and metrology equipment that combines in-depth wafer test data with the advanced thermal characterization capabilities of a thermal imaging chamber. The comprehensive software package integrates easily with modern thermal imaging systems, providing users with real-time thermal data and long-term Stability analysis. The software is designed for use in a wide range of testing environments, from traditional low-temperature to temperature-controlled laboratory settings. SlimKIC 2000's advanced test chamber is designed to accurately measure thermal variations in thin wafers, even in the most extreme thermal conditions. The chamber utilizes a unique combination of infrared thermal imaging, thermocouple array sensors, and patented PID stabilization algorithms to ensure accurate and repeatable test results. The system includes a wide range of test parameters including temperature range, time, thermal cycle steps, ramp rate, and measurement speed. In addition to its versatile testing capabilities, KIC THERMAL SlimKIC 2000 features a host of advanced features to boost user productivity. A comprehensive library of test templates allows users to easily set multiple tests with just a few clicks. A graphical user interface lets users quickly analyze test results, compare thermal transitions, and create printable reports. SlimKIC 2000 is also designed for ease of maintenance and upgrades. The software can be expanded with module packs to support specialized test and measurement requirements. Additionally, the unit includes a power saving feature that allows the chamber to automatically switch to low power modes when not in use, decreasing energy consumption and extending maintenance intervals. KIC THERMAL SlimKIC 2000 is the perfect choice for engineers and researchers looking for a versatile wafer testing and metrology machine. When combined with its advanced software package, SlimKIC 2000 makes fast, accurate, and reliable wafer testing a reality.
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