Used KLA / FILMETRICS F20 #293637542 for sale

KLA / FILMETRICS F20 is a wafer testing and metrology equipment designed to provide reliable, repeatable, and accurate measurements of various characteristics of semiconductor wafers. The system utilizes light interference technology to precisely characterize a variety of material properties, including thickness, topography, and other surface characteristics. KLA F20 consists of four main components: a precision stage, light source, optics, and electronics. The precision stage is used to scan the wafer and control the location relative to the light source. The light sources are highly stable LEDs, emitting light in the visible wavelength. The optics are specially designed lenses and filters which control the direction and polarization of the emitted light. The electronic components provide the power and necessary data to the unit. FILMETRICS F20 has two types of built-in measurement parameters: single-point and linear scan. For single point measurements, the stage moves to a user-defined location, and the machine measures the peak-to-peak amplitude of reflected light. This information is then used to calculate the thickness, topography, and other material characteristics of the wafer. For linear scan measurements, the user defines a path and the tool scans the wafer using the same peak-to-peak amplitude measurement process as with single-point measurements. All data is then collected and processed to generate a 2D topography map. F20 is designed to provide fast, accurate, and repeatable measurements of wafers. The onboard electronics use advanced algorithms to adjust for changes in conditions, such as thermal drift and vibration. The asset also allows for verification of measurement accuracy and repeatability, providing feedback if a measurement is out of tolerance. KLA / FILMETRICS F20 has an optional SRS module which makes custom characterization correlation measurements. KLA F20 is an ideal tool for materials testing and process control of semiconductor wafers. The model is easy to install, use, and maintain and features user-friendly operation. It provides a wide range of measurement capabilities for accurate characterization of wafers at high speed.