Used KLA / FILMETRICS F20 #293665953 for sale

KLA / FILMETRICS F20 is a wafer testing and metrology equipment that offers comprehensive one-stop measurements for both low (100-200nm) and high (1-20um) lateral resolution SIR and thickness metrology applications. The system features a fully automated, non-contact optical design, providing fast and accurate results with minimal operator input and eliminates the need for user calibration. The unit's optical grating-based autofocus and stage scanning technology, coupled with its broad application library and automated data analysis routines, allows for real-time automated inspection, sorting, and classification. This enables the highest level of accuracy and repeatability in the market and eliminates manual interpretation and adjustment. KLA F20 includes a library of data analysis routines for measuring feature sizes, roughness, lamination, topography, etch-rates and more. It also provides automatic classification of failure modes and severity levels. In addition to collecting vital statistics on wafers, the machine can also be customized to capture a variety of other parameters, up to and including analysis of layering and photo resist characteristics. FILMETRICS F20 is certified to work with semiconductor and optoelectronic applications such as thin film deposition, mask making, lithography, etching, plating, metallization, and wafer cleaning. It supports standard substrates including Si, Ge, Al, InGaAs, and GaN. The tool can be equipped with a variety of detection heads and lenses to suit the customer's metrology needs. F20's intuitive user interface provides easy navigation through its comprehensive menu, enabling users to quickly set up the necessary parameters for their tests. The asset offers a variety of visualization tools, allowing users to modify settings and view results in real time. Additionally, its advanced data processing capabilities allow users to quickly export results to Excel for further analysis. The model also offers a full suite of diagnostic and traceability capabilities. Its troubleshooting tools enable users to quickly diagnose problems and troubleshoot, while its traceability capabilities allow users to track parts, runs, and results. Lastly, the equipment is designed for easy of use, requiring minimal qualifications for operation. Overall, KLA / FILMETRICS F20 system is an extremely useful tool for wafer testing and metrology, offering comprehensive, automated, and accurate measurements that improve the production and inspection process. By combining its intuitive operation and visualization functions, fast results, accurate measurements, and traceability capabilities, this unit offers a complete solution for demanding wafer testing needs.