Used KLA / TENCOR 0266951-001AA #9401898 for sale

ID: 9401898
Vintage: 2012
System 2012 vintage.
KLA / TENCOR 0266951-001AA is a 'wafer testing and metrology' equipment designed for the efficient measurement and testing of semiconductor wafers. The system is a fully automated 'in-line' tool designed to take measurements while wafers are in motion. The unit features a high resolution, motorized wafer stage capable of speeds of up to 10mm per second which can be adjusted for different wafer types and sizes and can handle up to 200mm wafers. The microscope is equipped with a CCD camera for imaging and a quadrant diode array for measurement and alignment. KLA 0266951-001AA is equipped with fully automated pattern recognition, mask alignment and measurement functions such as non-destructive cross-sectional measurements and electrical PEAK testing. It also provides wafer flatness measurements and defect mapping, which helps when performing stress tests on wafers. The machine boasts a state-of-the-art user interface which allows users to set up, control, monitor and program the wafer testing, metrology and inspection systems with ease. The tool also features a charting utility to provide graphical representations of the measured data. TENCOR 0266951-001AA uses a number of advanced algorithms to analyze the data and provide feedback to the user. The asset can also be used to run simulations to predict and assess the lifetime of wafers and provide early warnings on issues such as particle contamination. 0266951-001AA model is an invaluable tool for wafer testing and metrology. It can help improve product quality, reduce costs and ensure consistent results. The equipment is easy to use and is capable of high throughput with accurate and reliable results.
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