Used KLA / TENCOR 10-02000 #9248699 for sale

KLA / TENCOR 10-02000 is a wafer testing and metrology equipment which provides fast, reliable, and accurate detection of defects in semiconductor wafers. The system utilizes sophisticated technology to deliver superior imaging, analysis, and wafer process monitoring capability. The unit utilizes advanced imaging and analysis techniques to detect and analyze arbitrary shapes, integrate large pattern databases, create and evaluate comparative analyses, and perform non-destructive optical measurements on a variety of structures, such as high-resolution images of line features and 3D structures. It incorporates automated operation so that it can rapidly and accurately inspect and measure a variety of wafer configurations. KLA 10-02000 is designed for enhanced through-silicon-via (TSV) inspection, as well as for wafer-to-wafer , and wafer-to-die comparisons for yield enhancements. It has a repeatable process that provides for later identification of any flaw or defect and helps ensure process integrity and traceability. The machine also has a state-of-the-art vibration isolator table, allowing for precise wafer placement and metrology accuracy. Additionally, the temperature controlled stage ensures superior repeatability for all temperature-sensitive measurements. It impresses with a powerful image acquisition-and-analysis tool that supports the comprehensive front-to-back inspection of flat surfaces and slanted, through-silicon-via structures. It includes a multi-spectral charge-coupled device (CCD) camera, along with advanced optics and digital image processing. TENCOR 10-02000 offers versatility and very little maintenance, as well as consistent results every time. Its low cost and less than one percent downtime make it an excellent tool for any production line. It is also capable of simultaneously executing up to three processes, and can print Wafer Maps to inspect wafer integrity, including interconnect thickness and uniformity. 10-02000 delivers an unmatched level of performance and versatility for wafer testing and metrology. By combining advanced imaging, analysis, and wafer process monitoring technologies, the asset can detect, measure, and analyze any type of wafer with speed and accuracy. Its versatile design makes it ideal for a wide variety of wafer testing needs, while its reliable performance and low maintenance costs make it a cost-effective solution for any production line.