Used KLA / TENCOR 2.1 Surfscan #9043947 for sale
KLA 2.1 Surfscan is a wafer testing and metrology equipment designed for semiconductor manufacturing. It utilizes a range of advanced technologies, such as photon-emitting diodes, laser plumes and other optical systems, to inspect semiconductor wafer substrates. The system is engineered to detect defects on the surface of the wafers, allowing the users to identify and address any issues as they occur. The Surfscan 2.1 has a rugged, industrial-grade design, allowing it to operate in harsh semiconductor production environments. It is comprised of a powerful controller, multiple high-resolution cameras and optics, robust motion control, and sophisticated metrology algorithms. The unit utilizes advanced image analysis methods to rapidly scan wafers and detect any variations from the expected pattern. The device's combination of computed tomography, laser plumes, and photon-emitting diodes allow it to precisely analyze the wafer surface on a nanometer scale. It is equipped with the ability to detect features that are in the range of 100nm which is well beyond the capabilities of other semiconductor inspection systems. The machine is able to rapidly assess a wide range of different wafer conditions, such as deposition quality, surface roughness, and resistivity. It has comprehensive defect classification capabilities to allow an advanced assessment of wafer integrity. It can also perform automated measurements of both positive and negative defects, reducing the need for manual assessments. In addition, the Surfscan 2.1 can be integrated with other systems, such as production controllers, robotic arms, and vision systems, for a comprehensive tool control. This allows for fully automated testing and defect detection without any manual intervention. In addition, it has an intuitive user interface for easy operation and automated analysis. Overall, TENCOR Surfscan 2.1 is an advanced wafer testing and metrology asset designed to accurately inspect semiconductor wafers. It is engineered with a robust design and advanced metrology algorithms for highly accurate results. With its sophisticated defect detection capabilities and integration with other systems, it provides an advanced solution for quality control in semiconductor manufacturing.
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