Used KLA / TENCOR 2915 #9168923 for sale

ID: 9168923
Wafer Size: 12"
Vintage: 2012
Inspection system, 12" 2900 Ducting DFIHS PHOENIX v2.0 VQ line 45 kVA 25 Cassette HH 12" SW DSH 065 Haze Shiny 2915 IDA rack E84 Error recovery suite Dual E84 RGV & OHT, PHX, DFIK SHHKO E87 / E39 E90 K40 / K94 GEM / SECS HSHS 2 Onron VG40 V3 CID PHX SHHKO Safety skirt DFIHS, PHX OHT, E-stop and lockout, DF PHX Dual loadport info pad kit G4 FIHS Ionization remote blower conversion kit Blower cable: 290X/1X (50ft) 20m Main power cable: 290X/1X 2900 Logic and memory inspection modes Optics available: 0.05, 0.065, 0.08, 0.09, 0.12, 0.16, 0.2, 0.22 Exposure modes: Blue band Broad band UV Deep band UV Middle band UV Ultra broad band Ultra deep band GH I Line G Line HI Line I Line VIS 2012 vintage.
KLA / TENCOR 2915 is an automated wafer testing and metrology equipment designed for the production of high-performance semiconductor devices. It provides complete digital testing and metrology functions for the industry's most advanced photolithography equipment. The system is a fully digital, automated, and white-light scanning metrology platform, capable of extremely accurate measurement of small features on semiconductor wafers. The unit uses an advanced optical imaging machine to precisely measure small-scale features with nanometer accuracy. It is capable of measuring up to a maximum of 10,000 wafer parameters including: line-widths, critical dimensions (CDs), edge-deviations, and flatness of wafer surfaces. The tool includes two modules: the ADC (analog-to-digital converter) and the metrology module. The ADC module converts analog information into digital data; the metrology module acquires images of wafer surfaces, which are then analyzed for accuracy. The asset provides high-speed data acquisition and can automatically detect and identify features on the wafer. The model is built on a reliable software platform, which provides superior data management tools and a user-friendly graphical user interface. It also has a variety of software modules designed to analyze the data and present it in an easy-to-understand format. The equipment is designed to take full advantage of available industry standards such as SEMI and ISO standards. It is fully compatible with the industry's most advanced semiconductor fabrication tools and equipment. It is also built with an easy upgrade path, enabling users to easily expand the system's capabilities as needed. KLA 2915 offers a wide range of features and benefits to support the high-tech industry. It provides users with the ability to acquire and analyze extremely accurate data quickly and efficiently. It is designed for easy operation and minimal maintenance, providing high-quality testing and metrology results. Furthermore, its excellent software platform ensures compatibility with other devices in the industry. TENCOR 2915 unit is designed to provide a complete and highly reliable solution for wafer testing and metrology requirements. Its advanced optical imaging, high-speed data acquisition, and intuitive software make it an ideal choice for any semiconductor production line.
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