Used KLA / TENCOR 3440D-12-8004-SA #293665812 for sale

KLA / TENCOR 3440D-12-8004-SA is a wafer testing and metrology equipment designed to provide fast, accurate, and repeatable measurements of IC wafers. The system is capable of inspecting both single and double-sided devices simultaneously on up to 8 different levels. The unit consists of the 3440D InLine Wafer Scanner, the 3400 Series Optical Critical Dimension (OCD) machine, and the 3400 R500 Auto-Probe Tool. The 3440D scanner uses a line-of-sight, or 'zero-order' illumination technique to capture images of the wafer and allow for precise measurements of both topographical and structural features. The 3400 Series OCD asset utilizes laser-interferometry to provide highly accurate dimensional measurements of the IC wafer's features. The 3400 R500 Auto-Probe Model enables wafer probing to determine electrical characteristics of each individual circuit and chip. KLA 3440D-12-8004-SA is a cost-effective, reliable solution for wafer testing and metrology. It is scalable and upgradable, allowing for flexible configurations to match specific needs. The equipment is designed with ergonomic considerations to provide unparalleled ease of use, as well as ensuring optimal safety for the users. Its advanced programming capabilities provide quick and accurate measurements and data analysis, as well as automated routine tasks. The system is compliant with both 1D and 2D Barcode standards, allowing for efficient data retrieval and storage. It is also compatible with multiple types of wafers, including ceramic, thin film, and stacked wafer. TENCOR 3440D-12-8004-SA is an ideal solution for manufacturers looking to improve their wafer testing and metrology processes. Its advanced features and precise measurements can reduce overall costs, while ensuring quality products. The unit's scalability and customizability makes it suitable for use in a wide range of applications, from production lines to research and development. 3440D-12-8004-SA is the perfect tool for manufacturers looking to improve their wafer testing and metrology capabilities.