Used KLA / TENCOR 4000 SURFSCAN #9388542 for sale

KLA / TENCOR 4000 SURFSCAN is a state of the art wafer testing and metrology equipment designed to provide a wide range of automated, advanced wafer scanning and analysis capabilities. The system combines advanced technology and innovative features to provide high-speed, high-accuracy wafer characterization and analysis. The SURFSCAN 4000 is designed for the most demanding wafer testing environments and is also suitable for field and laboratory measurements. KLA 4000 SURFSCAN utilizes high dynamic range imaging and laser scatter algorithms to measure a wide range of physical and chemical characteristics on a single-wafer within minutes. This technology enables the fast capture and characterization of all pertinent die-level characteristics, including recessed dielectrics, flip chip solder ball location and size, open/closed contacts, raised die bumps, solder paste, notes, and ball and etch defects. Wafer metrology is further enhanced by use of auto-focus capabilities to obtain precise examination of the wafer's surface topography. The SURFSCAN 4000 unit is equipped with automated inspection, comprehensive on-board metrology capabilities and powerful data analysis functions. An advanced optics subsystem provides superior imaging and non-contact wafer metrology, extending the machine's capabilities to measure surface parameters such as knots, protuberances, slips, etc. Automated Inspections and metrology functions are operated through a graphical user interface (GUI) to enable quick measurement and analyses of both single and multiple wafer lot examinations. The advanced data analysis offers a comprehensive suite of measurement capabilities, including, but not limited to, drop detector, corner detectors, field of view, signal to noise measure, and etch rate. The integrated optical testing and metrology tool enables consistent, repeatable measurements and eliminates costly data interpretations. The SURFSCAN 4000 asset is the leading industry solution in wafer testing and metrology. With its advanced technology and innovative features, it provides increased speed, accuracy, repeatability, cost-efficiency, and flexibility to meet the most demanding wafer test and metrology needs. It is the optimal solution for routine and high-volume wafer test needs, as well as field and laboratory applications.