Used KLA / TENCOR 4500 SURFSCAN #293598476 for sale

KLA / TENCOR 4500 SURFSCAN is a revolutionary wafer testing and metrology system, designed to help monitor the performance and quality of semiconductor chips. With its integrated combo sensor, KLA 4500 SURFSCAN offers a comprehensive sensor platform for monitoring a comprehensive range of microstructures on the surface of a wafer. Its high performance and scalability makes it ideal for a myriad of applications, ranging fromresearch and development, to defect tracking, to on-site metrology. At the heart of TENCOR 4500 SURFSCAN is its combo sensor that consists of four different probers for a variety of measurements that include contour, reflected light, and contour/reflection. The contour prober works by comparing a 3D profile of the wafer surface to its previous scan, allowing the machine to detect any changes that may have occurred. The reflected light prober then captures light reflected off the surface of the wafer at different angles to form an image that can be used to identify specific structures. The contour/reflection prober combines both processes to give an even more detailed picture of the wafer surface. 4500 SURFSCAN also comes equipped with powerful image processing and analysis software. It leverages advanced algorithms to analyze images and detect surface variations that may indicate defects. The software can also be used to interpret data and generate reports based on the results of scans. Additionally, KLA / TENCOR 4500 SURFSCAN can integrate with other systems and processes, enabling it to be part of an automated wafer fabrication workflow. KLA 4500 SURFSCAN is a powerful tool for inspecting and analyzing surface features on semiconductor wafers. It provides an incredibly detailed picture of the wafer surface and can detect even the smallest of defects. Its sophisticated image processing and analysis capabilities, as well as its ability to integrate with other systems and processes, make it an incredibly powerful asset for any wafer fabrication facility.