Used KLA / TENCOR 4500 SURFSCAN #293603502 for sale

KLA / TENCOR 4500 SURFSCAN is a wafer testing and metrology equipment used in the semiconductor industry. It is designed to measure features on semiconductor wafers with high accuracy and sensitivity, allowing for monitoring and quality control of the manufacturing process. It is also capable of defect inspection and can be used for process development and reticle qualification. KLA 4500 SURFSCAN system uses a bright light source, linear motorized stages, a laser interferometric stage, and a CCD camera to acquire data quickly and accurately. The unit is designed to measure two or four inch semiconductor wafers. It is capable of measuring wafer thickness, total substrate flatness, and feature size. For process development and reticle qualification, the machine specializes in measuring various electron beam patterns on the wafer. The laser interferometric stage gives the tool the improved accuracy and superior stability required for high-resolution metrology. The movement of the stage is driven by a linear motor, allowing for fast and accurate motion control. The CCD camera has high resolution and is capable of acquiring image data with higher dynamic range, enabling it to detect very faint features on the wafer. The asset also has an advanced on-board microprocessor. This enables the model to perform wafer testing and metrology automatically. It is equipped with a user-friendly graphical user interface with intuitive controls and customizable measurements. TENCOR 4500 SURFSCAN is a highly efficient and accurate tool for wafer testing and metrology. Its advanced features and high precision enable it to provide a reliable quality control solution for the world's leading semiconductor manufacturers. It is an invaluable asset in the industry and is now a standard part of manufacturing environments.