Used KLA / TENCOR 4500 SURFSCAN #293822877 for sale
URL successfully copied!
Tap to zoom
ID: 293822877
Wafer Size: 2"-6"
Vintage: 1988
Wafer inspection system, 2"-6"
1988 vintage.
KLA / TENCOR 4500 SURFSCAN is a high-end wafer testing and metrology equipment that offers automated and comprehensive data measurement and analysis capabilities. It offers unsurpassed performance and accuracy in process control, monitoring, and probe corrections. KLA 4500 SURFSCAN provides highly accurate metrology results in a wide range of wafer process and materials with full automation, enabling production floor testing to be faster and more reliable. It features an integrated four-axis stage that offers sub-micron accuracy and unparalleled throughput, enabling automated inspection of the entire wafer or entire reticle or die. The system uses the latest algorithm technology and software to rapidly switch between process-specific tests, while enabling simultaneous measurement of multiple test parameters. The unit also offers advanced metrology capabilities, including thickness profiling, defect sizing, embedded resistivity and stress testing. Its design ensures optimal process control by allowing automated feedback from automated test results to the process. This helps to minimize variations in process results, resulting in higher yield and improved product quality. In addition, TENCOR 4500 SURFSCAN machine is highly configurable, meeting multiple process requirements. Its modular design includes a range of options, including different diameter of wafers, reticles, or dies, optimized exposure techniques, and multi-lithography systems. The tool also features an integrated administrative console, allowing operators to define and manage test sequences, monitor equipment performance, and customize test parameters. It also offers a user-friendly graphical user interface, enabling easy setup and operation of the asset. Overall, 4500 SURFSCAN is an industry-leading wafer testing and metrology model that offers cutting edge capability and scalability for optimal process control. Its streamlined design, advanced measurement capabilities and flexibility make it an ideal choice for wafer fabrication applications.
There are no reviews yet