Used KLA / TENCOR 4500 SURFSCAN #69242 for sale

KLA / TENCOR 4500 SURFSCAN is a wafer testing and metrology equipment that offers best-in-class inspection and metrology performance capabilities. The system combines high-speed patterned wafer inspection and defect review, characterized 3D measurements, shape measurements with profile mapping, and inline review in one unit. KLA 4500 SURFSCAN is built on a state-of-the-art multi-task, multi-threaded architecture. The 4500 machine provides enhanced performance for optimum wafer quality control. It offers true automation in both front-end loading and unloading, enabling repeatable accuracy with improved throughput. The tool also offers repeatable automated performance for metrology, ensuring repeatable accuracy for consistency. TENCOR 4500 SURFSCAN utilizes a powerful asset architecture to achieve high-speed performance. For example, it can deliver up to 20 wafers per hour with up to 5.2 MPixels/sec scan rate. The advanced inspection capabilities allow for finer details on narrow spaces, small defects, corner patterns, and gate lengths. The model also delivers advanced pattern recognition with its sophisticated pattern matching capabilities. For metrology, 4500 SURFSCAN features a high-speed 3D measurements, shape measurements with profile mapping, scatterometry, and reflectometry. Through its onboard computers, it can generate fully featured results, review data, and generate reports quickly. KLA / TENCOR 4500 SURFSCAN is built with an Industrial Robotic Protocol (IRP) that offers fully automated end-to-end wafer handling. It can manage the loading and unloading of wafers which are scanned and measured in one pass. The equipment features a unique ergonomic design, enabling easy and intuitive user access. The system's intuitive software design provides an easy-to-use interface for simple operation. KLA 4500 SURFSCAN offers automated unit operation, through a comprehensive suite of Machine-oriented tools. Automation tools such as Analyzer Tool Suite, Standards Manager, and Defect analysis, enable users to define critical steps and reduce hands-on time. The tool also features a secure working environment with data storage, backup, and recovery. TENCOR 4500 SURFSCAN offers a variety of benefits to end users, such as improved reliability, repeatability, and throughput. Its advanced capabilities make it an ideal solution for high-performance quality control in sub-micron metrology and defect review. It is a reliable, comprehensive asset for wafer testing and quality control applications.