Used KLA / TENCOR 4500 SURFSCAN #9229796 for sale

KLA / TENCOR 4500 SURFSCAN is a state-of-the-art wafer testing and metrology equipment, designed to provide the highest level of performance and accuracy for both wafer inspection and metrology. Featuring a large field of view, a combination of 150mm, 200mm and 300mm optics, with the highest resolution achievable, and the latest in advanced software control, KLA 4500 SURFSCAN is the ideal choice for the most demanding surface characterization applications. At the core of TENCOR 4500 SURFSCAN is a large-field, high- Throughput Optical Microscope (HTOM) designed to provide the highest level of accuracy and speed. This system features a large field of view, a combination of 150mm, 200mm and 300mm optics, and a range of contrast modes. The unit can simultaneously capture 15 wafers per run and can provide powerful and accurate surface analyses of multiple wafers at once, with no need to stop and re-position the sample. By utilizing the latest in advanced calibration methods, the machine can accurately measure up to 4-sigma height variation from the initial calibration. 4500 SURFSCAN is also equipped with advanced software control, designed to make the most of its large-field of view and impressive optical performance. The tool features an intuitive user interface, powered by powerful image analysis software that can quickly process and generate real-time results. This software allows the user to easily control, analyze and interpret scans within a fraction of the time normally required. In addition to wafer imaging, KLA / TENCOR 4500 SURFSCAN also offers full 2D/3D metrology capabilities, including critical dimension scanning and overlay measurements. This significantly simplifies complex device fabrication processes, giving users the tools to precisely control critical features such as line widths, trenches, widths and heights. KLA 4500 SURFSCAN also offers further enhanced functionality, thanks to its impressive "Smartscan" technology. This automated feature can quickly scan multiple wafers with as many as four lasers for each wafer, making it easy to detect microscopic defects quickly and accurately. This is supported by automated defect detection software, making it possible for users to quickly analyze large wafer samples and identify any defects, making it one of the most advanced wafer testing and metrology systems available. Overall, TENCOR 4500 SURFSCAN offers unsurpassed levels of performance and accuracy, making it the ideal choice for even the most demanding surface characterization needs. Featuring a large field of view, superior optics, advanced software control, and automated features, 4500 SURFSCAN makes it quicker and easier to accurately analyze surfaces, offering unprecedented levels of productivity and reliability.