Used KLA / TENCOR 4500 SURFSCAN #9356377 for sale

KLA / TENCOR 4500 SURFSCAN Wafer Testing and Metrology Equipment is an automated metrology tool designed for inspecting microelectronic chips. This system enables the inspection of multiple layers and components of microelectronic devices such as transistors, resistors, capacitors and other small electronic components. This unit also provides detailed automated electrical testing of the wafers. KLA 4500 SURFSCAN machine uses advanced optical scanning technology in order to detect defects in the electrical properties of the wafers. This tool utilizes an advanced laser-based asset to detect electrical characteristics such as resistance, capacitance, thin-film layers, and metallurgy. This model is equipped with a precision surface map which can detect small irregularities in the surface of the wafer. The 4500 offers advanced fail-safe management with fault-tolerant imaging capabilities. The equipment is highly automated and features a full suite of data acquisition, analysis and visualization tools. The 4500 also has advanced metrology algorithms that are specific to each wafer or die lot. This technology is used to quickly and accurately analyze electrical metrics for fast and reliable results. In addition to the system's capabilities, the 4500 also offers a comprehensive suite of software options that enable the user to customize the inspection to their specific testing requirements. This includes the ability to control the scan speed, sensitivity, filter settings, and shading algorithms. These customizations provide the user with the ability to tailor their tests to the unique requirements of each wafer. TENCOR 4500 SURFSCAN offers a high level of accuracy and reproducibility of results. This unit is capable of detecting numerous different defects and performing accurate measurements and analysis. The machine also offers a comprehensive data management tool for creating reports and archiving measurements. This asset can be used with various types of wafers, including metal film and tape, flip-chip, diced wafers, and thermal compression bonded wafers. 4500 SURFSCAN is a powerful and highly automated wafer testing and metrology model. With its fast, accurate testing and data analysis capabilities, the 4500 is an excellent choice for manual or automated wafer inspection. It can be used in a variety of wafer applications from semiconductor fabrication to IC packaging. This equipment offers great flexibility and accuracy, allowing it to meet a wide array of quality assurance needs.