Used KLA / TENCOR 4500 #293626895 for sale

KLA / TENCOR 4500
ID: 293626895
Wafer inspection system.
KLA / TENCOR 4500 is a state-of-the-art wafer testing and metrology system designed for the analysis and optimization of advanced semiconductor wafer fabrication processes. The system features a highly automated, modular design that makes it ideal for high-volume production in both research and industrial settings. KLA 4500 is comprised of three main components: a wafer mapping unit, a wafer test unit, and a data analysis unit. The mapping unit is responsible for making accurate surface measurements of the wafer in order to identify areas of interest that need to be further tested and analyzed. This is done by scanning the wafer with a high-resolution, high-speed imaging camera. The scanned images are then analyzed by the integrated software to determine the coordinates of specific areas of interest. The wafer test unit is responsible for carrying out a series of tests and measurements on these areas of interest. These tests include measurements of electrical characteristics, chemical characteristics, and structural characteristics in order to properly assess the quality of the wafer. The data collected from these tests is stored in the integrated database for further analysis. Finally, the data analysis unit is responsible for interpreting the data collected from the tests. Using sophisticated algorithms and analysis techniques, the data is used to create detailed quality maps of the wafer, allowing for a thorough understanding of the wafer's defects and performance. Additionally, the data analysis unit is capable of providing recommendations for corrective and preventative measures, making it an invaluable tool to prevent defects and ensure high quality production. TENCOR 4500 is an invaluable tool in both research and industrial semiconductor production, allowing for efficient and accurate analysis of wafer production processes. It is a versatile, reliable, and user-friendly system that can be quickly set up and configured for a variety of analyses and measurements.
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