Used KLA / TENCOR 5000 Surfscan #293590364 for sale

KLA / TENCOR 5000 Surfscan
ID: 293590364
Wafer Size: 8"
Inspection system, 8".
KLA / TENCOR 5000 Surfscan is an advanced, high-performance wafer testing and metrology equipment. This next-generation tool delivers superior results through high throughput, repeatable and reliable surface analysis, along with exceptional hardware and software. The system is designed to address demanding imaging and analysis requirements for wafer applications. It offers high magnification and resolution, high speed scanning and data acquisition, superior wafer-to-wafer repeatability, and a comprehensive range of metrology and surface analysis solutions. It uses a blemish-free imaging process to create ultra-sharp images that are ideal for accurate grain sizing, surface finish evaluation, defect measurements, compositional analysis, and 3D topography. KLA 5000 Surfscan is built on a modular platform with a choice of single and multi-axis stages. It has a flexible range of resolutions and a maximum scan area of 650mm x 650mm. The unit can also be upgraded with a range of accessories, such as a high-resolution backside imaging machine and an automated die-to-die scan modul. This increases the range of applications that can be fulfilled by TENCOR 5000 Surfscan. In terms of optics, the tool is equipped with a state-of-the-art optical head, which ensures exceptional imaging performance. The high-resolution optical head has diffraction-limited optics, automatic LED level control, and a cooled digital camera. The asset also features an intuitive, easy-to-use user interface with graphical interface and built-in reflex vision algorithms. It has a high linearity, repeatability, and accuracy, allowing the user to closely monitor the critical parameters of her or his sample. 5000 Surfscan is also capable of 2D and 3D statistical analysis and reporting. It contains robust software for data analysis, including for automated stitching and defect analysis. KLA / TENCOR 5000 Surfscan truly is a high-performance, versatile Wafer Testing and Metrology tool. Its robust design and cutting-edge components provide the user with reliable and repeatable results, making it a valuable tool for any industry that requires accurate surface analysis or metrology. This next-generation model is perfectly suited for a wide range of intensive applications, from semiconductor manufacturing and failure analysis to advanced material research and development.
There are no reviews yet