Used KLA / TENCOR 5100 XP #293763497 for sale

KLA / TENCOR 5100 XP Wafer Testing and Metrology equipment is a high performance, flexible, and versatile platform for wafer inspection, measurement and defect location. It provides fast and accurate characterization of wafers for front-end process analysis and monitoring. KLA 5100 XP is designed to achieve the highest throughput at the lowest cost by leveraging the ultimate performance of construction techniques and methods. Its pre-production and production-capable performance capabilities are provided by an automated, modular Wafer Inspection and Measurement system, which consists of a broad range of powerful, advanced component technologies. TENCOR 5100XP utilizes advanced lighting techniques to obtain the highest signal-to-noise ratio while reducing exposure times and increasing throughput. Its core imaging technologies consist of 650 nm diascopic wide-angle illumination, brightfield and darkfield imaging, patterned illumination, UV mapping, active pixel correlation, and hyperspectral imaging. The unit also features the industry's best defect detection, characterization, and classification algorithms. In addition, its automated wafer carriers and advanced line-based scanning module enable the highest possible throughput while its highest resolution sensors allow the smallest critical defects to be detected. TENCOR 5100 XP also features high-speed defect inspection and metrology, high-throughput wafer imaging, and a unique Auto-Align™ technology for opto-mechanical accuracy. 5100 XP machine has been designed for use in production environments, including high-volume production environments. It has been enhanced to meet the needs of the most demanding production processes while providing the highest throughput in wafer testing and metrology. 5100XP's fast scanning, high resolution, and advanced defect detection algorithms provide the highest level of inspection tool accuracy ever, in the fastest time possible. This makes KLA / TENCOR 5100XP the most suitable solution for critical inspection applications. Furthermore, its advanced Measurements and Process Monitoring technologies offer advanced technology for classifying micro-to-nano scale size defects, reliabilities assessment, and process analysis. In summary, KLA 5100XP Wafer Testing and Metrology asset is a highly advanced and powerful model for wafer inspection, measurement and defect detection. It offers optimized performance in both pre-production and production environments and is capable of producing the highest throughput and lowest cost-per-die results while providing the ultimate accuracy in the fastest time possible.