Used KLA / TENCOR 5100 XP #9248760 for sale

KLA / TENCOR 5100 XP Wafer Testing and Metrology Equipment is a versatile and powerful system used for the measurement and testing of semiconductor wafers. The unit is capable of measuring a wide range of parameters in order to accurately characterise wafers and evaluate electrical performance and reliability. KLA 5100 XP machine consists of four sub-systems - image metrology, electrical measurement, defect review, and analytics. The image metrology tool is used for scanning wafers and detecting defects in the form of particles, scratches and other surface abnormalities. This sub-asset is also capable of performing image segmentation, analysis and grading of the defects. The Electrical Measurement sub-model is used to measure and analyse electrical parameters including resistance and capacitance across the wafer. This sub-equipment also provides important information such as gate width, doping concentrations and transistor leakage current. The Defect Review sub-system is designed for monitoring and reviewing electrical and optical verification results, allowing for the rapid identification of failing elements and strategies for correcting any issues. The unit is also capable of sorting and analysing defect images and test data for the purpose of creating accurate and repeatable results. Finally, the Analytics sub-machine is used to generate advanced analytics. The tool can identify defects and provide insight into various aspects of the wafer manufacturing process. It can also provide statistical analysis of wafer testing and metrology data. In conclusion, TENCOR 5100XP Wafer Testing and Metrology Asset is a versatile and powerful model which provides a range of functions for wafer testing and metrology. The equipment is capable of measuring a wide range of electrical and optical parameters and provides advanced analytics for tracking and improving the process.