Used KLA / TENCOR 5100 #9042215 for sale

ID: 9042215
Overlay inspection system.
KLA / TENCOR 5100 wafer testing and metrology equipment offers a full range of fully automated testing and metrology capabilities. As such, it is an essential part of any semiconductor research, manufacturing, and inspection program. KLA 5100 boasts an impressive array of advanced features, dedicated to providing efficient and accurate testing and metrology solutions. Operating on an advanced software platform, TENCOR 5100 allows for single wafer testing and metrology, with a choice of either film or 3D wafer mapping capabilities. In addition, the system can perform real-time metrology, enabling users to quickly identify potential issues in their wafers and improve yields. The unit's advanced optics can achieve a resolution of 1-2 microns, enabling users to precisely interpret results in the highest resolution. The machine is capable of both high and low-light imaging, making it suitable for a variety of metrology applications. In addition, 5100 supports multi-zone imaging, allowing for testing of multiple sites, as well as tilted and scanned wafers. KLA / TENCOR 5100 also features an intuitive user interface, making it easy to get started with. The tool is equipped with direct USB connection capabilities and files can be saved in several different formats, making it easy to transfer data in and out of the asset. In addition, the model supports both manual and automated operation, allowing users to choose the best mode for them. In conclusion, KLA 5100 offers an extensive array of features and capabilities, making it an indispensable tool for benchmark testing and metrology in the semiconductor industry. The equipment's advanced imaging, resolution, multi-zone capabilities and intuitive user interface make it ideal for research, production, and inspection and enable users to accurately interpret results and save time.
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