Used KLA / TENCOR 5107 #146169 for sale

ID: 146169
Wafer Size: 5"
Inspection System, 5".
KLA / TENCOR 5107 is a wafer testing and metrology equipment that utilizes high-resolution imaging combined with data analysis to measure the physical properties of a wafer's surface. It is a fully automated system that is capable of testing and verifying the accuracy of multiple wafers in parallel, ensuring defect-free production and analysis of the materials being tested. KLA 5107 utilizes multiple laser beams and light sensors to create high resolution images of small structures and defects on the wafer's surface. Through the use of advanced image processing algorithms, the unit can detect and measure small changes in the wafer's roughness and contours that may be indicative of defect or process variations. This enables the machine to isolate the problem areas, allowing for rapid and reliable defect and process monitoring. In addition to offering reliable and accurate results, TENCOR 5107 also offers exceptional speed and flexibility. The tool is able to measure and analyze an entire wafer within minutes including all measurements as small as 0.2 nanometers. It features a variety of interchangeable components that can be used in different testing scenarios. These components are robust and can be used over extended periods of time without experiencing significant wear and tear. 5107 output is accessible through a variety of formats such as graphical prints, databases, and file systems. All data can be exported directly to an engineering workstation, laboratory, or any other type of control asset. This model is also highly versatile and can be configured to accommodate a variety of test applications. In conclusion, KLA / TENCOR 5107 is an advanced wafer testing and metrology equipment that combines high-resolution imaging, sophisticated image processing algorithms and a variety of interchangeable components to reliably and accurately deliver accurate results in a fast and flexible manner.
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