Used KLA / TENCOR 5107 #9120918 for sale

ID: 9120918
Inspection systems.
KLA / TENCOR 5107 wafer testing and metrology equipment is an advanced technology that enables the accurate measurement, testing and characterization of semiconductor wafers. The system uses advanced optics and microsensors to detect microscopic defects on the wafer surface and measure its physical characteristics. The unit operates in a high vacuum to eliminate any dust particles which could interfere with the measurements. KLA 5107 machine features an integrated wafer handling tool that allows the wafer to move in three dimensions, enabling more precise measurements and testing. The integrated measurement arm features an array of sensors which is capable of measuring multiple slices of the wafer at once. The asset utilizes advanced analysis software which analyzes data gathered from the sensors and generates a detailed wafer map and process report. TENCOR 5107 model offers numerous advantages compared to other wafer testing and metrology systems. It can measure smaller defects due to its advanced optics and integrated wafer handling equipment. It is also capable of measuring variations in the thickness of a wafer and capturing the characteristics of surface tension and adhesion which can impact the performance of a semiconductor device. 5107 system includes a user-friendly graphical user interface, accessible from PCs and mobile devices, which provides full control over the measurement and testing process. The unit can also be easily synchronized with existing software and databases, enabling seamless integration into existing production pipelines. KLA / TENCOR 5107 machine is specifically designed to operate in a clean room environment and offers superior performance in this setting. The tool is equipped with a high-efficiency air cooling asset, purification model, and vacuum chambers that improve performance and reduce risks of contamination. The equipment is also designed to reduce costs by reducing the labor required to measure and test the wafers. Automated systems such as KLA 5107 are capable of faster testing cycles and are more accurate than manual processes. Their use can also reduce costs arising from errors and defects. Overall, TENCOR 5107 wafer testing and metrology system is an advanced and reliable tool for measuring and testing semiconductor wafers. The unit offers countless advantages compared to other metrology systems, such as its ability to measure smaller defects, its user-friendly interface and its automatic processes, which can save costs and time.
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