Used KLA / TENCOR 5107XP #9241509 for sale

KLA / TENCOR 5107XP Wafer Testing and Metrology Equipment is an advanced quality control tool designed for the semiconductor industry. The system includes hardware and software components designed to accurately measure and analyze physical characteristics of wafers, including their sizes, shapes, and surface qualities. The unit is based on high-accuracy optical technology, and takes advantage of sophisticated software-based image processing algorithms to acquire accurate measurements in a fraction of the time it would take with manual methods. The hardware of KLA 5107XP includes an advanced optical inspection head that uses a high-brilliance CCD camera to acquire image data. The machine features a 5-axis motorized stage, which allows for scanning over the entirety of the wafer in multiple directions. The stage can be programmed to cover a large area, or to scan over sections of the wafer in more detail. This allows for precise measurements of wafer size, shape, and surface features such as bumps, pits, and other irregularities. The software of TENCOR 5107XP is designed to work with the hardware to process the image data. It includes image processing algorithms that can detect, identify, and classify a wide variety of features. Advanced statistical analysis algorithms enable the tool to quantify any measurements it takes, which can then be used in the assessment of wafer quality control and process management. 5107XP is capable of testing and metrology in a high throughput fashion. The inspect head and 5-axis stage can be controlled by an automated program which allows for rapid scanning of the whole wafer in minutes, rather than hours when done manually. This helps ensure that each wafer is inspected quickly and thoroughly, allowing for control of quality and process management throughout the manufacturing process. KLA / TENCOR 5107XP asset is considered an indispensable tool for the semiconductor industry. Its accurate, high-throughput measurements help ensure consistent wafer quality control, and its sophisticated analysis algorithms allow for pinpoint assessment of process performance on a wafer-by-wafer basis. As such, the model is ideal for maintaining the highest levels of product quality and reliability from wafer fabrication to finished product.