Used KLA / TENCOR 5200 #9233117 for sale

KLA / TENCOR 5200 is a wafer testing and metrology equipment designed for semiconductor manufacturing. This system offers excellent accuracy and speed for wafer testing, making it the most advanced metrology unit available on the market. KLA 5200 features a compact design, allowing for it to fit onto a 200mm or 300mm manufacturing line. It also features an advanced software package and hardware architecture, providing superior performance for wafer sampling. This machine is capable of testing multiple substrates simultaneously, including silicon, gallium arsenide, aluminum oxide, and other materials. TENCOR 5200 utilizes optical scatterometry and interferometry to accurately measure wafer parameters across a range of layers, processes, and steps. It is capable of measuring optical, electrical, physical, and chemical parameters of a wafer and its associated technologies. Data is then collected by the tool and analyzed to ensure that quality standards are maintained. With the help of 5200's on-site computing capabilities, the asset is able to make real-time adjustments to the wafer, process, or substrate in order to refine any defects. It also has the ability to recognize dynamic trends in the wafer's performance. KLA / TENCOR 5200 generates automated metrology reports that can be exported, transmission electron microscopy (TEM) images which show defect features, and cross-sectional images of the wafer material. KLA 5200 offers a host of other benefits, including improved yield management, a wide range of supported applications, and remote control capabilities. Its modular design enables users to easily replace or upgrade its parts with components from other manufacturers. The model is compatible with industry standard interfaces, allowing it to be integrated with production control and data collection systems. Overall, TENCOR 5200 is an advanced and reliable wafer testing and metrology equipment that offers a host of features. It is capable of accurately measuring a wide range of parameters across numerous substrates, layers, and processes, providing valuable insight into the performance of the wafer. This system provides users with a fast, accurate, and reliable way to measure, test, and analyze wafers and its associated technologies, making it an invaluable tool for semiconductor manufacturing.