Used KLA / TENCOR 5500 Surfscan #194942 for sale

KLA / TENCOR 5500 Surfscan is a wafer testing and metrology equipment used in the semiconductor industry. The system excels at detecting surface and interface defects on wafers, and provides powerful statistical data analysis to enable device engineers to accurately determine performance characteristics. KLA 5500 Surfscan unit is used for a broad range of applications across the wafer fabrication process, including quality assurance, yield improvement, process characterization, failure analysis and root cause analysis. The machine offers high performance across a range of wafer sizes and applications to ensure maximum quality control. TENCOR 5500 Surfscan tool enables manufacturers to quickly detect surface and interface defects on the wafer that could otherwise impact the quality of the final device. It features three primary technologies that enable it to achieve fast and accurate testing: Scanning White Light Interferometry (SWLI), Multi Angle Convergent Beam Electron Diffraction (MACE), and Scanning Electron Microscopy (SEM). SWLI delivers fast and highly sensitive wafer surface metrology by detecting even the smallest subtle variations in surface and interface shapes. MACE helps reduce false defect detections and can be used to characterize interfacial properties on a wide variety of technologies. Finally, SEM provides automatic detection of structural defects such as poor dopant coverage or poor contact formation. 5500 Surfscan asset also offers a number of advanced features that help engineers avoid false rejections and accurately determine performance characteristics. These include statistical data analysis, customizable processes, and real-time defect detection. These features make it easy to detect and diagnose defects quickly so that manufacturers don't waste resources remaking the same kinds of defective wafers. Overall, KLA / TENCOR 5500 Surfscan is an invaluable tool in modern semiconductor manufacturing. It perfectly blends a range of advanced technologies into one comprehensive wafer testing and metrology model that maximizes efficiency and helps device engineers accurately determine performance characteristics and detect dangerous defects.