Used KLA / TENCOR 6200 Surfscan #293675905 for sale

KLA / TENCOR 6200 Surfscan is a wafer testing and metrology equipment that provides superior defect detection, review, location and classification of all kinds of defects on semiconductor wafers, from microbumps and bridging down to oxide pits, particles, scratches and crystal defects. KLA 6200 Surfscan is built on an advanced CMOS technology platform which enables direct electrical measurements of the resistivity gradient and surface topography. The system features automated calibration pattern recognition, high resolution video capability displaying defect images directly to the microscope operator's computer screen, as well as a sophisticated image analysis capability for defect detection, review, location and classification. TENCOR 6200 Surfscan's integrated defect review and metrology features a range of technologies, from wafer mapping and defect location to defect assessment and electrical measurements. These capabilities enable 6200 Surfscan to automatically detect, review, and locate defects with great accuracy and speed. The unit also provides high resolution wafer mapping and defect assessment information, giving users the ability to accurately determine the nature of the defect and its impact on the wafer. The machine supports high resolution imaging or scanning in any direction, and includes an ergonomically designed viewfinder and LED backlighting for the user's convenience. The advanced optics and precision electronics of KLA / TENCOR 6200 Surfscan allow it to obtain a wide variety of electrical measurements from the wafer surface. The low noise and high dynamic range of the tool provide fast, accurate electrical measurements for a variety of wafer test operations, including design verification, device characterization and yield analysis. KLA 6200 Surfscan is also capable of performing resistivity mapping, providing users with an in-depth visual representation of the wafer's electrical properties. TENCOR 6200 Surfscan offers state-of-the-art capabilities for wafer testing and metrology. Its high-precision optics, advanced CMOS technology platform and sophisticated image analysis capabilities offer the utmost in defect detection, location, review and evaluation. The asset is the ultimate choice for the most demanding wafer testing applications.