Used KLA / TENCOR 6200 Surfscan #293807558 for sale

KLA / TENCOR SFS 6200 is an advanced wafer testing and metrology equipment. Developed by KLA, the system utilizes advanced in-die sensors and spectroscopy, to provide precision analysis of semiconductor wafers. The unit is particularly useful to semiconductor manufacturers, providing fast, accurate, and cost-effective wafer testing and metrology. KLA SFS 6200 features dual in-die sensors (position sensor and focus sensor) that use linear diode array and laser interferometry to accurately measure the position, pitch and depth of wafer surfaces. Additionally, it includes a spectrometer for precise optical imaging and lit imaging for measuring defects and surface roughness. With its advanced optical machine, TENCOR SFS6200 provides superior resolution and reliable performance for testing samples of any size. The tool uses a Vision 4.2 software package which includes intuitive user interface, defect review, off-line review, programmable automation and other high-level capabilities. The software allows the user to customize automated processes, automate multiple parametric measurements and analyze data using statistical methods. It also provides a wafer sketching tool which can be used to quickly identify features of interest on a wafer and render them as a two-dimensional image on the monitor. TENCOR SFS 6200 provides excellent flexibility and is ideal for both basic and advanced wafer testing and metrology. It offers unsurpassed accuracy and repeatability, and produces comprehensive and consistent results that meet the stringent requirements of the semiconductor industry. Additionally, the asset is designed to optimize throughput, allowing faster measurement cycles and greater sample throughput. In summary, KLA / TENCOR SFS6200 is a powerful and reliable wafer testing and metrology model. With its advanced optics, user-friendly software, flexibility, and accuracy, SFS6200 is the ideal solution for any semiconductor manufacturer looking for precise and reliable wafer testing and metrology.