Used KLA / TENCOR 6220 Surfscan #9003557 for sale

KLA / TENCOR 6220 Surfscan is the latest version of a wafer testing and metrology equipment designed to inspect the surface of semiconductor wafers. This system uses a fast, high-resolution imaging and measurement unit to detect defects, ensure uniformity, and measure critical feature parameters. The machine is adapted from existing metrology equipment, with added features to improve reliability and reduce costs while maintaining high accuracy. The imaging tool utilizes the latest advancements in three-dimensional (3D) imaging to capture fast, detailed images of the surface of the wafer in both brightfield and darkfield modes. It also uses accurate measurements to identify defects, with a tolerance of better than one nanometer. The asset also offers automatic calibration and alignment to make sure the wafer remains aligned and stable while measuring surface features. It also offers a range of adjustable parameters, allowing the user to optimize the imaging and measurement functions for a variety of applications. The model also offers sophisticated software and interactive features that enable the user to customize test procedures. The control program allows the user to preset the exposure time, optical filters, and focusMode, to get the ideal measurement results. The user can also analyze the images to identify specific defects, such as scratches, pitting, and slip-stitching. In addition, the Surfscan 6220 includes a special software module for manual non-contact profiling, which automates the processing of results in visual or spreadsheet formats. The module also includes a high-density defect map feature, which allows the user to quickly identify and size defect features on the wafer. KLA 6220 Surfscan is designed with the latest technology to ensure that wafer manufacturing processes yield precise, reliable results. Its advanced imaging and measurement capabilities, interactive features, and sophisticated software put it head and shoulders above the competition.