Used KLA / TENCOR 6220 Surfscan #9054310 for sale

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ID: 9054310
Wafer Size: 8"
Vintage: 1999
Surface analyzer, 8", 1999 vintage.
KLA / TENCOR 6220 Surfscan is a state-of-the-art wafer testing and metrology equipment for semiconductor manufacturers. It utilizes advanced imaging technologies, sophisticated metrology algorithm development, and advanced data analysis capabilities to precisely measure and analyze wafers at very high resolution. The Surfscan's automated optical inspection and metrology techniques provide high precision results while at the same time increasing throughput. It features an automated vision system along with a high-resolution camera and two optical imaging lenses. This allows the Surfscan to gain a detailed view of each wafer and measure its surface features. The unit can detect defects within the wafer, including scratches, cracks, and other defect features. It also has the ability to measure surface characteristics such as texture, reflectivity, surface roughness, contour, and other features. The Surfscan can even provide a 3D map of the wafer's surface to help identify anomalies and defects that would otherwise be difficult to find. The machine also features a high-speed image data acquisition and analysis tool. This allows it to collect and measure data quickly and accurately. It can also store and analyze large amounts of data. The Surfscan also contains sophisticated metrology algorithms that enable it to detect and identify extremely small defects on the surface of the wafers. These algorithms have been developed to provide the most accurate readings possible. Finally, the asset also contains a powerful data analysis model. This equipment can analyze data from previous scans to provide an overall picture of the wafer's defects. This data can be used to pinpoint the exact location and characteristics of the defects, as well as potential root causes. KLA 6220 Surfscan is an ideal system for any manufacturer that needs high-resolution automated optical inspection and metrology capabilities. It is able to provide quick and accurate results, while also allowing for detailed data analysis that can help manufacturers produce the highest quality wafers possible.
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