Used KLA / TENCOR 6220 Surfscan #9070113 for sale

KLA / TENCOR 6220 Surfscan is a state-of-the-art wafer testing and metrology equipment capable of inspecting and measuring a variety of semiconductor wafers and die steadily and quickly. Its components include a light source, two cameras, a computer system, and a variable pressure head. The unit is designed to identify nano-sized contaminating particles and defects with stunning accuracy, giving insight into wafer's uniformity and quality. KLA 6220 Surfscan utilizes a high-powered light source to illuminate the wafer and displays a two-dimensional image of the surface for inspection. The machine then utilizes two high-resolution cameras and sophisticated optics to scan the wafer. This allows the computer tool to analyze and create a map of the wafer, highlighting its topography. The asset allows a user to select areas of interest for surface profiling and measurement; data regarding those areas can be viewed in real time on the computer display. The model also features a variable pressure head, which is utilized to provide uniform contact between the sample surface and the optics before imaging takes place. This allows TENCOR 6220 Surfscan to detect fast-changing topographical features while compensating and factoring in differences in sample, illumination, and detector response. 6220 Surfscan is able to measure several critical parameters, such as Mean Roughness, surface area, and slope. The equipment is also capable of performing multiple inspections in one session, significantly reducing time spent in the inspection process. Its user interface is designed for ease-of-use, allowing users to find and identify faults quickly and easily. In conclusion, KLA / TENCOR 6220 Surfscan is an all-encompassing wafer testing and metrology system capable of providing comprehensive insight into the characteristics of the wafer, including its topography, various parameters, and uniformity. Its heavy-duty design and advanced features make it a valuable and efficient tool for semiconductor wafer inspection and measurement.