Used KLA / TENCOR 6220 Surfscan #9168251 for sale

KLA / TENCOR 6220 Surfscan
ID: 9168251
Automatic surface inspection system.
KLA / TENCOR 6220 Surfscan is a powerful wafer testing and metrology equipment designed to meet the needs of semiconductor and opto-electronic device manufacturers. It is a high-speed wafer analysis system that offers a comprehensive suite of physical and optical metrology capabilities. The unit delivers a resolution of up to 5 nanometers, making it ideal for measuring nanoscale structures and device features. It offers an array of optical characterization capabilities, including a dedicated focus-variation (FV) measurement machine that can be used to characterize the depth of the surface structure. The tool utilizes a precision stage scanning asset to accurately measure nanoscale structures and features. This model is capable of scanning a wafer up to a maximum size of 8 inches (200 millimeters) in diameter. The high-accuracy nanostaging equipment provides a resolution of up to 1 nanometer, and the system can measure a variety of roughness parameters that are relevant to device performance and reliability. KLA 6220 Surfscan also offers a suite of advanced automated surface metrology capabilities. The unit uses an intuitive graphical user interface (GUI) to quickly and easily produce highly detailed surface profile results. The machine offers multiple scan modes and automatic feature extraction that can be used to extract the characteristics of complex structures and features. These features can then be compared against user-defined reference standards to determine conformance. TENCOR 6220 Surfscan also provides a variety of critical defect detection capabilities. The tool has the ability to detect various types of surface defects such as patterning failures, contamination, scratches, bumps, dents, and cracks. The asset detects, measures, and classifies defects automatically with superior performance compared to manual inspection. 6220 Surfscan is also equipped with an impressive set of analysis options. It offers a wide variety of parameterization and characterization capabilities, including surface profile comparison and image analysis. The model also includes software tools for generating comprehensive data reports and graphically displaying surface structure data. KLA / TENCOR 6220 Surfscan is a versatile and powerful wafer testing and metrology equipment that offers a variety of capabilities and features. It offers very high measurement accuracy and a wide range of advanced features, making it a great choice for device manufacturers who require reliable and precise surface metrology for their products.
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