Used KLA / TENCOR 6220 Surfscan #9189779 for sale

KLA / TENCOR 6220 Surfscan is a state-of-the-art wafer testing and metrology equipment designed for the inspection of semiconductor wafers. It combines a range of advanced inspection, measurement, imaging, and analysis technologies to provide users with unprecedented accuracy and precision in the inspection of wafers. The system consists of several core components, including a high-resolution CCD camera assembly, an automated sample loading unit, an imaging laser, a CCD device, and an automated metrology head. Each of these components has been precisely engineered and designed to work in harmony to provide users with superior performance. The CCD camera assembly utilizes a pair of high-resolution cameras to capture images of the wafer surface with extreme detail and accuracy. It combines precision optics, advanced software algorithms, and a CCD device to capture images with resolution up to two-micrometers. The images are then transferred to an onboard computer for further processing. The automated sample loading machine allows for quick and reliable loading and unloading of wafers. The tool includes a probe arm that extends over the chamber, and a sample loading plate that holds up to two wafers. A dual-stage actuator is used to move the probe arm to and fro across the chamber, and an automated sample holder is included for precise and accurate sample positioning. The imaging laser is used to produce a pool of high-resolution images of the wafer surface. It consists of an LED source, a laser scanner, and a board-level camera, and provides an unbeatable imaging resolution up to 0.1 micrometres. These images are used to produce detailed contour and surface maps of the wafer surface, and offer unprecedented accuracy in wafer testing and metrology. The CCD device is used to measure the parameters of the wafer surface at a static point, providing an instantaneous assessment of the wafer surface condition. The CCD device enables users to accurately detect small defects, such as scratches, pits, and other features, that may be difficult to spot through imaging alone. The automated metrology head provides users with an automated way to measure the surface topography of the wafer, providing an instantaneous assessment of the surface features. The device quickly and accurately measures the parameters of the wafer surface, and is able to detect any surface irregularities with great accuracy. KLA 6220 Surfscan wafer testing and metrology asset is a powerful tool for inspecting and maintaining the quality of semiconductor wafers. It is a powerful combination of imaging, metrology, and analysis technologies, all engineered and designed to offer the highest accuracy and precision in wafer testing and metrology. With this model, users can ensure that their wafers meet their desired standards of quality and reliability.