Used KLA / TENCOR 6220 Surfscan #9358653 for sale
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KLA / TENCOR 6220 Surfscan is an advanced wafer testing and metrology equipment, designed for use in semiconductor fabrication facilities. This system is optimized to perform fast, high-precision metrology on wafers of various sizes and shapes. It provides unparalleled process control for device manufacturers, allowing them to quickly identify patterns, defects, and other anomalies that could be causing their wafer processing problems. The 6220 consists of several key components that work together to measure and analyze wafers. The first element of the unit is the metrology tool, which includes a laser interferometer for measuring wafer topography. This high-precision measurement tool is capable of taking readings on the nanometer scale, allowing for ascertainment of extremely fine details. It allows for accurate analysis of the surface and shape of the wafer. The second element is the computer hardware and software that make up the Surfscan's operating machine. With a powerful server, large storage capacity, and advanced programming, the Surfscan can be configured for a variety of wafer analysis tasks. The tool is controlled by automation software that can be used to define measurement modes, set sampling times, and handle image storage and retrieval. The third element is the image acquisition portion of the asset, which is used for capturing images of the wafer during measurement. These images are stored on the model, allowing for easy retrieval of the data and analysis. The equipment is also equipped with powerful analytical software that can be used to perform a variety of calculations. Finally, the system is equipped with advanced communication capabilities, allowing it to be integrated with other support systems in the semiconductor facility, such as the factory control unit. This enables the Surfscan to better track wafer testing results, diagnose problems, and evaluate process steps. When considered as a whole, KLA 6220 Surfscan is a powerful tool for device manufacturers. It provides a comprehensive metrology machine with advanced measurement, image acquisition, and diagnostic capabilities that make it ideal for the fast and accurate testing and analysis of wafers of various sizes and shapes.
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