Used KLA / TENCOR 6220 Surfscan #9379353 for sale

KLA / TENCOR 6220 Surfscan is an advanced wafer testing and metrology equipment. It is designed to rapidly and accurately detect, locate, and characterize defects on even the most intricate patterned surfaces. KLA 6220 Surfscan utilizes a high-resolution CCD camera and proprietary algorithms to generate an automated inspection or review of a device's entire surface. The system's software is designed to detect and analyze defects present on wafers. Features such as pattern recognition, line width measure, and inter-level die to die (ILDTD) comparison allow it to detect even the most subtle defects. Additionally, its automated review and inspection procedures greatly reduce the risk of false positives. TENCOR 6220 Surfscan also provides a comprehensive range of pre-defined defects, which the unit uses to effectively distinguish between acceptable imperfections and defect clusters. 6220 Surfscan also offers a variety of inspection modes to optimize the machine's performance. These modes can be tailored to the particular wafer geometry as well as the types of features being evaluated. Additionally, various parameters such as settings and algorithm type can be adjusted to ensure the tool is running at peak efficiency. KLA / TENCOR 6220 Surfscan's highly accurate and reliable results make it an ideal choice for a variety of wafer testing and metrology applications. By utilizing the asset's advanced detection and analysis capabilities, manufacturers can quickly and effectively detect and characterize defects on their wafers. Additionally, its automated review and inspection procedures can remove the need for manual review and improve the accuracy of results. In summary, KLA 6220 Surfscan provides a fast, reliable, and cost effective solution to identify defects on wafers.