Used KLA / TENCOR 62XX / 64XX #9024565 for sale

KLA / TENCOR 62XX / 64XX equipment is a versatile, precision wafer testing and metrology system designed for semiconductor and other microelectronics markets. This unit is designed for high-volume production and offers measurements that provide reliable, accurate results in a wide range of applications. This machine is capable of performing a variety of process-critical metrology functions, including dimension measurements and defect inspections. KLA 62XX / 64XX tool is capable of conducting a range of wafer test and metrology functions at varying levels of accuracy and speed. The asset is able to measure the height, depth and width of structures with accuracy levels down to 0.5 micron. It can also detect specular and sub-specular defects on samples ranging from small spotting to large die embedment. TENCOR 62XX / 64XX model features two types of testing: film-thickness and wafer dimension measurements, as well as optical inspection. The equipment combines a combination of sophisticated optical and mechanical components for high-precision, high-accuracy results. It utilizes a system of stage and filters for enhanced film-thickness testing. Additionally, the unit features an advanced optics module that helps to verify the imaging quality and accuracy of test results. 62XX / 64XX machine also features two types of wafer dimensions: .001 and .0002. The .001 tool has a true resolution down to 2 microns, while the .0002 asset has a true resolution down to 0.5 microns. Thisresolution is essential for precision structural and defect measurements. KLA / TENCOR 62XX / 64XX model is not only capable of testing and measuring a wide range of samples, but is also incredibly easy to use. The equipment is automated and requires minimal maintenance. It features a simple, intuitive user interface that supports a range of software scripts for automated execution and data collection. Additionally, it features an Integrated Imaging System which is designed for enhanced observation of both structural and surface features on the samples. In summary, KLA 62XX / 64XX unit is a versatile, precise wafer testing and metrology machine designed for the semiconductor and microelectronics markets. It is easy to use, requires minimal maintenance, and features a range of testing and measuring options. It is a valuable tool for precise measurements and can help to make the process of displaying, analyzing, and interpreting data more efficient and informative.