Used KLA / TENCOR 6300 #9394711 for sale

KLA / TENCOR 6300 Wafer Testing and Metrology Equipment is used to measure a variety of physical properties of wafers for semiconductor manufacturers. It is a high-precision tool that offers a variety of wafer test and measurement capabilities. KLA 6300 system utilizes two integrated subsystems. The first is a die-to-die imaging capability, which allows users to measure both 2D and 3D topography of a wafer, and the second is a high-resolution spectroscopic ellipsometer, which can measure a variety of physical properties including optical absorption, refractive index, and surface roughness. TENCOR 6300 unit's imaging functions are used to capture 2D images or video information within a nanometer spatial resolution level. This allows for the capture and analysis of a high level of detail that may not normally be visible to the naked eye. The machine also has the ability to capture 3D images of wafers, which enable accurate measurements of thickness, step heights, and other critical layer characteristics. 6300 tool's spectroscopic ellipsometer capabilities include the ability to measure optical properties such as the reflectivity and absorbance of a wafer in a frequency range from 250 to 2,500 nm. This helps determine a wafer's thickness, refractive index, and film thickness. KLA / TENCOR 6300 also offers a range of measurement techniques, including fixed or variable angle measurements, polarization manipulation, and high speed measurements, which provide accurate and repeatable results. In addition to these features, KLA 6300 also has powerful data management capabilities, which enable users to access and analyze data from different systems, store information in user-defined ways and easily create custom reports. This helps streamline the wafer testing process and improve overall efficiency. TENCOR 6300 is an excellent tool for quality control in semiconductor manufacturing and is suitable for both research and in-line process control applications. The reliability, accuracy, and data management capabilities of 6300 make it an ideal instrument for wafer testing and metrology applications.