Used KLA / TENCOR 640 #9248670 for sale

KLA / TENCOR 640
ID: 9248670
System.
KLA / TENCOR 640 is a wafer testing and metrology equipment designed for high-performance, automated wafer production. It is a highly reliable, modular solution for a wide range of processes and applications, offering fast, repeatable measurements, accurate data, and low-cost maintenance. KLA 640 system consists of two main components: the semiconductor metrology unit and the wafer test machine. The metrology tool consists of a vision asset and a metrology tool, which together can measure critical device or circuit features such as dimensions, depth, surface quality, and other parameters. The wafer test model includes a test handler, test fixtures, testers, and a platform for controlling the tests. The vision equipment incorporates advanced imaging technology with high resolution, integration of multiple test processes, and rapid response to dynamic product changes. The vision system also provides a clear image of feature locations and dimensions for easy measurement. The metrology tool combines mechanical and electronic systems to accurately measure different types of feature geometries, configuration, and tolerances. Thetest handler is capable of supporting multiple tests, including electrical and optical testing, temperature testing, vibration testing, and surface characterisation. The test fixtures are tailored to ensure compatibility with a wide range of products, and are designed to protect delicate structures from contamination. The testers are used to validate product performance and are supplied in a variety of configurations for different applications. Finally, the platform allows the user to manage multiple processes, triggering actions, customising commands, and programming different test parameters for automatic execution. The unit also includes a comprehensive reporting machine for documenting and analysing results. TENCOR 640 is an effective, cost-efficient solution for meeting high-volume production needs. It helps improve throughput by quickly recognising product features, reducing cycle times, and reducing rework. Moreover, its modular design and configurability makes it suitable for upgrades and the integration of future technologies.
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