Used KLA / TENCOR 6420 #293605952 for sale

KLA / TENCOR 6420 Wafer Testing and Metrology Equipment is a fully automated metrology system designed to inspect and measure the key metrics of semiconductor devices at the wafer level. KLA 6420 unit is equipped to provide comprehensive defect-detection and process- monitoring capabilities to help ensure the highest quality of a variety of advanced process nodes and breakthrough technologies. TENCOR 6420 machine is capable of a wide range of inspection and measurement tasks, ranging from production-line defect inspection to complex wafer mapping, particle detection and automated defect repair. Features such as 3D mapping, custom automatic sample handling, laser-based edge and defect detection, as well as high-definition image processing and CCD technology, are just some of the integrated measurement capabilities engineered into 6420 platform. KLA / TENCOR 6420 tool has the capacity to completely analyze a wafer surface with its numerous measurement capabilities and precision algorithms. Moreover, KLA 6420 asset is equipped with laser reflectometry, which is enabled through optimized optics, illumination, and acquisition hardware. This allows for precise wafer mapping that meets the most demanding process requirements. TENCOR 6420 model is also capable of automated particle detection and elimination. Its high-definition wafer particle detection tools help insulate wafers from potential interference caused by particles or contamination while still being able to identify and isolate particles that could interfere with the circuit's operation. This feature is useful in guaranteeing the quality of the overall circuit design. Moreover, 6420 Equipment provides a wide range of data-acquisition and analytical capabilities designed to deliver more accurate data for more reliable wafer characterization and process control. KLA / TENCOR 6420 system is optimized for high throughput, enabling quick and efficient turnaround for production testing. Furthermore, KLA 6420 platform is compatible with a range of metrology systems to expand capabilities, ensuring greater accuracy and performance. In conclusion, TENCOR 6420 Wafer Testing and Metrology Unit is a revolutionary platform capable of meeting the most demanding semiconductor production requirements. Its integrated feature set supplies accurate analysis of the wafer surface and its features, allowing for precise wafer mapping and automated particle detection and elimination. This makes 6420 machine the ideal platform for a wide range of process nodes and advanced technologies.