Used KLA / TENCOR 7200 Surfscan #293664994 for sale

KLA / TENCOR 7200 Surfscan is a complete wafer testing and metrology equipment designed to meet the needs of the semiconductor industry. It is capable of testing a wide range of wafer formats ranging from standard 2-8 inch wafers to large and ultra thin wafers. This system offers a comprehensive suite of advanced wafer testing and metrology tools including opticalCritical Dimension (CD) measurements, Optical Profile (OP) measurements, Laser Width (LW) measurements, Noise Reduction Unit (NRS) and Real Time Defect Localization (RTDL). KLA 7200 Surfscan enables comprehensive testing and analysis of wafers from both the top and bottom side. It utilizes its patented Automated Scanning Laser Machine (ASLS) to simultaneously measure and analyze patterns across an entire wafer. The combination of advanced tools and intuitive software features enable TENCOR 7200 Surfscan to quickly perform comprehensive testing and analysis, saving valuable time and money. 7200 Surfscan offers a versatile CD/OP Measurement Tool with a wide-field view microscopy asset capable of performing rapid pattern lateral verification, CD measurements, and optical profile measurements. The model also offers a Laser Width Measurement Module which can measure an array of widths of lines/spaces on a wafer using a non-contact based measurement. The Noise Reduction Equipment (NRS) feature of KLA / TENCOR 7200 Surfscan enables measurements to be automatically corrected for external noise factors such as background noise, fringe effects, and interference. The Real-Time Defect Localization feature offers precise defect location analysis in both Cartesian and polar coordinates. KLA 7200 Surfscan also offers a variety of other tools including optical defect review analysis, specialized investigations, and statistical process control. The specialized investigations feature enables further analysis on defect or pattern structures not easily uncovered with optical measurements. The statistical process control feature provides statistical comparison of wafer data for process monitoring and control. TENCOR 7200 Surfscan supports a variety of hardware options, including probe cards, wafer handling systems, clean stations, and many others. These hardware options allow users to customize the system to fit their specific application. Additionally, the unit offers a wide-range of software programs developed to meet the exacting needs of the semiconductor industry. Overall, 7200 Surfscan is a comprehensive and highly advanced wafer testing and metrology machine that is specifically designed for today's demanding semiconductor industry. Its combination of unique features, sophisticated software, and hardware options make it an excellent choice for ensuring accurate analysis and testing of today's complex wafer formats.