Used KLA / TENCOR 7600 #9300225 for sale

ID: 9300225
Wafer Size: 8"
Vintage: 1993
Particle inspection station, 8" Patterned surface inspection system ARGON Laser Power supply: 208 V, 60 Hz 1993 vintage.
KLA / TENCOR 7600 wafer testing and metrology equipment is a fully automated metrology system, designed to measure and analyze wafer properties such as die size, flatness, defect parameters and contamination. The unit combines high-precision optical sensing with advanced image processing to accurately and quickly measure a wide range of parameters, such as surface topography, defect characteristics, geometry, and contamination. The machine is built with a high-performance architecture focusing on accuracy, speed and precision. Its high-end illumination and high-resolution camera configurations provide superior signal acquisition for exceptional results. The integrated high-resolution imaging enables fast scan rates and superior image resolution. The robust scanning capability has been proven to accurately capture and measure both large and small features, enabling optimal inspection results. The integrated state-of-the-art software allows for intuitive user interface operation, making it effortless to quickly operate the tool. It enables flexibility to customize the setup of asset-level features to suit specific applications. The intelligent checklist function ensures that the wafer properties are rapidly measured and reviewed with minimal user interaction. The model incorporates comprehensive data analysis features, allowing users to store and analyze information at a granular level. This includes advanced visualization tools and statistical process control (SPC) to aid in process optimization. KLA 7600 offers excellent environmental compatibility, due to its energy-efficient design. The equipment is designed for continuous operation and its optimal dust protection makes it well suited for critical cleanroom applications. Overall, TENCOR 7600 wafer testing and metrology system offers a combination of powerful and reliable performance for a wide range of wafer testing and metrology applications. Its comprehensive feature set and superior optical performance make it an ideal solution for a variety of process control requirements.
There are no reviews yet