Used KLA / TENCOR 7700 Surfscan #293592610 for sale

KLA / TENCOR 7700 Surfscan is a high-performance wafer testing and metrology equipment. Equipped with a powerful optical microscopy stage, it can measure and analyze surface characteristics of semiconductor wafers and substrates. The system is capable of delivering powerful, reliable, and accurate results for routine and complex characterization applications. The Surfscan 7700 is powered by a dual TMS200 image processing and image analysis processor. It is equipped with a high-performance 8'' x 8'' tilt-translation stage and a 4-level automatic laser deskew unit. The platform also features a highly sensitive motorized Z-focus machine that allows precise vertical adjustment and a precise measurement range of up to 10 microns. The surfscan 7700 offers a wide range of wafer metrology capabilities including CD, Uniformity, Traceability, and Profile measurements. It can also quantitatively measure, historical and dynamic parameters such as surface roughness, Average-Height, Waviness, Step Height, Micro-Trenching, Settling, and Bow. The tool is compatible with an array of advanced optical accessories, including dynamic polarization platforms, oblique angle illuminators, artificial defect generators, and dark-field illuminators. It also features a proprietary lightstripe feature that further enhances illumination uniformity within the field of view. In addition to wafer metrology capabilities, the surfscan 7700 also offers wafer defect analysis capabilities. It can detect various types of non-visible defects such as particle defects, structural defects, and interface defects. With the help of its high-end sensor and scanning systems, it can accurately detect and count particle defects of less than 200nm in size. The Surfscan 7700 also features an advanced built-in feedback control asset which allows the model to dynamically adapt to changing environmental conditions in order to maintain optimal imaging performance and accuracy. Additionally, its compact design allows for easy installation in a variety of laboratory setups. In summary, KLA 7700 Surfscan is a high-performance wafer testing and metrology equipment that can be used for wafer surface characterization, wafer defect analysis, and environmental feedback control. It offers a wide range of advanced functionality, superb measurement accuracy and repeatability, easy installation, and excellent imaging performance.