Used KLA / TENCOR 7700 Surfscan #293645266 for sale

KLA / TENCOR 7700 Surfscan is a high-precision wafer testing and metrology system designed to monitor the geometric, electrical, and process characteristics of semiconductor wafers. By utilizing a suite of advanced imaging, probing, and surface analysis technologies, KLA 7700 Surfscan can assess the composition, quality, and performance of a wide range of products. TENCOR 7700 Surfscan is equipped with an advanced imaging system that utilizes an automated wafer loader and advanced automated brightfield 8-way reticle mapping technology. With its 100x and 200x magnification capabilities, this imaging system provides unprecedented detail, with spot size resolution of 0.003 μm. Furthermore, with blur reduction and enhancement capabilities, users can locate and measure small defects on a wafer surface accurately and quickly. To complement its imaging capabilities, 7700 Surfscan leverages a range of probes and probes-on-cables to precisely gather wafer measurements and other information. This includes features such as AC and DC electrical probing, as well as 3D optical profiling capabilities. With advanced noise reduction and on-axis beam positioning features, KLA / TENCOR 7700 Surfscan can capture highly accurate results with extremely low noise figures. Other features of KLA 7700 Surfscan include its integrated data collection, analysis, and storage capabilities. This includes specialized functions such as advanced automatic defect classification, defect statistics reporting, and step Repeat analysis. It also integrates with other KLA products, such as the 6500 AccuSphere and AccuSpark platforms, to further extend its capabilities. Finally, TENCOR 7700 Surfscan is designed with an open and modular architecture, enabling users to customize its functionality to their specific needs and activities. An intuitive graphical user interface offers simple step-by-step navigation, and a range of functions such as fault location and defect emulation are available. 7700 Surfscan is thus an indispensable tool for optimizing the production processes and quality of semiconductor wafers. Its advanced imaging and probing capabilities, integrated data collection and analysis features, and wide range of customization options allow for fast and thorough evaluation of intricate products.