Used KLA / TENCOR 7700 Surfscan #293653455 for sale

ID: 293653455
Vintage: 1998
Wafer inspection system 1998 vintage.
KLA / TENCOR 7700 Surfscan is an advanced wafer testing and metrology equipment used in the manufacture of highly integrated integrated circuits. It is a fully automatic system capable of inspecting both patterned and bare wafers quickly and precisely. KLA 7700 Surfscan unit utilizes powerful Micro-Reflectometry and Phase Shift techniques to provide fast and accurate measurements of wafer topography. The machine can also detect surface contamination levels and measure wafer flatness. The tool allows for both manual and automatic operation. During manual operation, users have access to advanced features such as the ability to adjust the focus and adjust the brightness of the image. The asset also offers user selectable illumination options. TENCOR 7700 Surfscan is equipped with an advanced image processing model that allows users to measure features down to 2.5 microns. This equipment provides an unprecedented level of accuracy for wafer feature measurements. The system also provides a variety of automated wafer feature measurement capabilities including surface roughness measurements, area measurement, local flatness assessment, and particle and defect analysis. The unit comes standard with a full suite of metrology products including KLA Autofocus 3D, which provides automated 3-D mapping and profiling of the entire wafer's entire surface. The 7700 machine is also capable of measuring the exact position of embedded layers and the distance between them. 7700 Surfscan is built with a rugged and reliable design that offers years of reliable operation. It is designed to provide consistent results, regardless of environmental factors such as dust, humidity, and temperature. To ensure peak performance, the tool is regularly calibrated and mirrors are regularly replaced. KLA / TENCOR 7700 Surfscan is an advanced wafer testing and metrology asset that provides users with a reliable and efficient means of inspecting and measuring features on both patterned and bare wafers. With its advanced image processing model, automated wafer feature measurement capabilities, and automated 3-D mapping and profiling capabilities, KLA 7700 Surfscan is an essential component of the production process for high-integrity integrated circuits.
There are no reviews yet