Used KLA / TENCOR 7700 Surfscan #293654401 for sale

KLA / TENCOR SFS 7700 is an automated metrology and wafer testing equipment designed to enable advanced, inline metrology and failure analysis during the semiconductor manufacturing and fabrication process. This system provides both high-resolution three-dimensional imaging of test structures on the wafer and advanced automated measurements, allowing for near-instantaneous feedback of critical process results. Together, this comprehensive technology enables comprehensive failure analysis, quality control and process optimization with unprecedented accuracy and control over the wafer process. KLA SFS 7700 offers superior 3D visualization capabilities with a variety of imaging techniques, including native optical microscopy technology and a high-speed scanning electron microscope (SEM). Additionally, this unit features advanced scene reconstruction algorithms for automated 3D feature that provide both increased speed and accuracy. The 7700 also includes a proprietary metrology package that can quickly and accurately measure feature sizes, shapes and topology. The 7700 also includes a Data Acquisition Machine (DAS) that provides data analysis capabilities in three domains: test wafer analysis, real-time process control and process yield optimization. The test wafer analysis component provides detailed feature maps that inform yield improvement plans, while the real-time process control component provides information on in-line quality and process detection at the individual wafer level. Finally, the process yield optimization component guides wafer quality improvement plans while providing early warnings of process drift and undesirable trends. Furthermore, the 7900 tool delivers powerful, yet flexible failure analysis capabilities that allow process engineers to pinpoint sources of process anomalies. The 7900 utilizes an optimized combination of techniques to accurately detect potential faults, such as die-to-die comparisons, measurement trend analysis, cross-wafer analysis, color map correlations and others to pinpoint potential failure drivers. Additionally, this asset can be automated for inline testing and process monitoring, providing improved process visibility and feedback capability. Overall, TENCOR SFS 7700 offers a powerful, intra-wafer testing model that provides detailed process control, advanced failure detection and optimization capabilities to improve semiconductor manufacturing and fabrication yields. This equipment's comprehensive metrology and imaging capabilities paired with its automated data analysis and failure detection capabilities provide users with the ability to quickly and accurately monitor and adjust the semiconductor manufacturing process for improved performance and product quality.