Used KLA / TENCOR 7700 Surfscan #293655831 for sale

KLA / TENCOR 7700 Surfscan is a wafer testing and metrology equipment that provides high-accuracy high-throughput non-contact wafer measurements. It is used to measure and inspect wafers of various doping levels, materials, and geometries for a wide array of industries. The system consists of a high-fidelity scanning optics, an integrated, high-definition active sensing unit, and a powerful real-time data acquisition and analysis package. These three integrated components work together to quickly and accurately measure and inspect wafers of various doping levels, materials, and geometries. The high-fidelity scanning optics provide an angular resolution of 1.25 µrad with an extended field of view, allowing a greater degree of image clarity and accuracy. This machine is designed to obtain accurate measurements from critical areas of the wafer, including steep slope profiling (SSU), critical dimension (CD), and pitch measurements. The integrated active sensing tool enables the asset to detect and classify defects in real time with greater accuracy and much faster cycle times than with traditional manual inspection. The model's algorithms are tailored to each wafer's characteristics, allowing for maximum detection efficiency. This high-performance sensing equipment is extremely accurate for very small defects, making it suitable for a range of fabrication processes. Finally, the powerful data acquisition and analysis package provides detailed results related to wafer line widths, defect sizes, and other intricate information without manual data interpretation. This sophisticated software package is capable of rendering quantitative results within milliseconds, giving surface metrology applications a timely and continuous flow of information. Overall, KLA 7700 Surfscan is an innovative and reliable wafer testing and metrology system. It is built to handle the most demanding wafer characteristics, providing high-accuracy measurements and inspections for a wide array of industries. The integrated unit is user-friendly and offers in-depth analysis of critical wafer features and their defects. This all comes together to provide the industry with an accurate and powerful tool for effective wafer testing and metrology.