Used KLA / TENCOR 7700 Surfscan #293662764 for sale

KLA / TENCOR 7700 Surfscan is a high-performance wafer testing and metrology system. It is designed for use in semiconductor fabrication and tester labs. KLA 7700 Surfscan offers an integrated suite of analytical tools that enable accurate and precise characterization of materials and substrates. TENCOR 7700 Surfscan offers researchers and engineers with the most comprehensive and accurate tools needed to identify, characterize, and characterize complex microelectronic structures and wafers. It utilizes the latest deep learning algorithms to provide precise, three-dimensional, non-destructive surface analyses of materials. The system has a fast throughput speed enabling testing of multiple wafers in a single session with full visualization of the results. It also offers a high level of imaging resolution and accuracy, allowing for detection and characterization of nanometer scale structures. 7700 Surfscan offers advanced measurement capabilities, including depth profile analysis, voltage contrast imaging, frequency-dependent scans, and Fourier-transform spectroscopy. Its configurable measurement parameters allow users to optimize inspection for their specific application needs. It also offers features such as contactless wafer probing, high-speed data acquisition, multi-channel scanning, and high data throughput. KLA / TENCOR 7700 Surfscan system can be customized with a range of options including pattern recognition capabilities, a user-friendly graphical user interface, a wide range of probes for accurate image acquisitions, and various signal acquisition modes. It is able to capture and process high-resolution images and meta-data in a single pass, providing an accurate characterization of the structure on the wafer surface. KLA 7700 Surfscan is a powerful and versatile wafer testing and metrology tool that provides the most comprehensive analysis of wafer surfaces. It enables engineers and researchers to identify, characterize, troubleshoot, and optimize complex microelectronic structures and substrates. Its advanced features and configurable parameters make TENCOR 7700 Surfscan ideal for various wafer testing applications.