Used KLA / TENCOR 7700 Surfscan #293749242 for sale

KLA / TENCOR 7700 Surfscan is a wafer testing and metrology equipment that offers high precision and repeatability in order to analyze front and backside of the semiconductor device. Developed by KLA, KLA 7700 Surfscan employs advanced opto-mechanical alignment to accurately identify and measure features. Using the latest industry standard linear variable differential transformers (LVDTs) and infrared laser displacement sensors, the system is capable of making a full wafer map for backside topology of individual dies. The opto-electronic methods used allow the unit to identify defects, from the size of a few microns to up to 35 mm in diameter. In order to provide the most accurate results, the Surfscan machine takes advantage of multiple beam illuminations and optical actuation of grating based optical stages. The combination of these two components ensure accurate measurements. Additionally, the tool uses calibrated measurement points to determine the exact shape of a feature, as well as its direction and angle. In addition to the detection of features and defects, the Surfscan introduces powerful automation features that allow users to accurately measure a variety of devices. Through the use of advanced programming algorithms, standard metrology techniques are leveraged to quickly and effectively capture the location, shape and size of features. The asset also provides options to measure die-to-die repeatability, as well as measure global parameters such as thickness, overlay, alignment and pitch. TENCOR 7700 Surfscan has a wide range of accommodation settings that support multiple wafer sizes and types. The model's short cycle-times and environmental compliance offers users the opportunity to make quick and reliable measurement in a cleanroom enviroment. This feature is ideal for semiconductor manufacturing and testing. As a next-generation wafer testing and metrology equipment, 7700 Surfscan offers the highest precision and accuracy for users seeking to closely monitor the manufacturing process of semiconductor devices. Through the use of advanced opto-mechanical alignment and opto-electronic methods, the system is capable of capturing small features, as well as defects, while providing an efficient workflow. By combining automation features and consistent measurement points, the Surfscan unit is an ideal solution for the semiconductor industry.