Used KLA / TENCOR 7700 Surfscan #9192129 for sale

KLA / TENCOR 7700 Surfscan is a state-of-the-art wafer testing and metrology equipment. This system enables precise and accurate measurements of semiconductor integrated circuits (ICs), opto-electronic devices, and wafers used for the production of semiconductor devices. KLA 7700 Surfscan incorporates advanced imaging technologies, such as scatterometry, ellipsometry, and surface roughness analysis, to provide detailed and reliable performance information for manufacturing processes in the microelectronics industry. Constructed on a modular platform, TENCOR 7700 Surfscan is a multi-functional unit designed for applications in both research and development and production. The integrated automatic stage provides unprecedented precision and accuracy for both flat and non-flat wafer measurement, allowing users to obtain reliable data in less time. Additionally, the built-in multi-axis scanning unit allows for users to acquire data from most wafer surfaces. The automated data acquisition mechanism allows for efficient resolution of issues, resulting in increased production yields. 7700 Surfscan is designed to interface with other control units and data acquisition systems, allowing for better productivity and efficiency. Key features of the unit include: High-resolution color CCD cameras for image analysis High speed, high accuracy multi-axis scanning machine Fully automated wafer alignment tool Computer-controlled wafer rotation stages Automated focus algorithms Fully automated data acquisition capability Automated data analysis tools The superior accuracy and detailed results that KLA / TENCOR 7700 Surfscan provides allow for users to maximize yield rates, while its flexible platform allows for its adaptation to the customer's specific requirements. Its modular design makes it easy to customize for specific process inspections or product capabilities. KLA 7700 Surfscan is an incredibly powerful tool in the semiconductor industry, providing reliable data with accuracy, precision, and speed. Its unique features and modular design provide the ultimate solution for testing and metrology applications for both research and production in the microelectronics industry.