Used KLA / TENCOR 7700 Surfscan #9198541 for sale

KLA / TENCOR 7700 Surfscan is a wafer testing and metrology equipment used to measure and characterize the physical, electrical, and optical characteristics of integrated circuits and microelectronic components. KLA 7700 Surfscan system is a key tool in the development, characterization, and production of semiconductor and opto-electronic components. The 7700 has a high-precision metrology unit with superior repeatability and accuracy. It is designed to measure features with sizes ranging from 1 nanometer to 6 millimeters, supporting a wide range of photolithographic techniques, including e-beam, DUV, ArFi, and visible imaging. Moreover, the 7700 can measure surface topography with a resolution of 0.01 nanometers. TENCOR 7700 Surfscan uses a variety of metrology technologies to perform a variety of tests, including scanning electron microscopy (SEM), atomic force microscopy (AFM), confocal microscopy (CM), white light interferometry (WLI), and optical scatterometry (OS). These techniques are used to analyze the geometry and properties of the circuits on that wafer. The SEM is used to observe the layout of the circuit, including the growth rate of the deposited metal on the surface. AFM provides a high-resolution, 3D image of the surface, allowing for the accurate characterization of surface roughness and the precise control of the roughness budget of the wafer. CM enables non-destructive imaging at both the large and small-scale resolutions and allows for the accurate characterization of device performance or features such as pseudo-speed and contact. WLI is a diffraction-based imaging technique that can monitor the condition and stability of coatings and thin films. OS detects the optical effects of the surface topography of the circuit board and is suitable for high-accuracy dimensional measurements and analysis of the surface of the wafer features. 7700 Surfscan is a feature-rich metrology machine, allowing for complete flexibility and scalability. It can be used for manual operation and automated scanning with its integrated hardware, such as data acquisition and analysis boards, or the operator can integrate third-party instruments, such as a scanning electron microscope interface. It can also accommodate a variety of probes, including manual and motorized stages, and be deployed with a large variety of software tools. KLA / TENCOR 7700 Surfscan tool is a reliable and cost-efficient metrology asset that allows for the measurement of the physical, electrical, and optical properties of circuits and components. It is used in a variety of development and production applications and is an essential tool in the semiconductor industry.