Used KLA / TENCOR 7700 Surfscan #9398780 for sale

KLA / TENCOR 7700 Surfscan is a wafer testing and metrology equipment that is used for inspecting microelectronic devices for process defects, particle contaminants and thin film thickness. It has a high precision three-axis motorized wafer stage to ensure accuracy, and a laser sensing system for detecting subtle surface variations. KLA 7700 Surfscan uses a diode pumped laser at 5x10-9 N/m2 to measure surface roughness from less than 0.2 to 5 µm, measuring differences within 0.1 nm. Its spatial resolution reaches 0.5 λ/ro for sizes between 0.5 and 4 µm. The unit can be set up for either static or dynamic wafer measurements and enables data collection in non-destructive and repeatable tests. TENCOR 7700 Surfscan also provides advanced data analysis tools such as particle detection, structures screening, classification, contour mapping and histograms. In addition, it provides traditional test pads and flat bands. Data acquisitions can be viewed in 3D, allowing for measurements to be accurately analyzed. These tools help to identify defects in the early stages of development, giving engineers a greater chance of correcting any issues before they become a full-scale problem. 7700 Surfscan also offers advanced defect review techniques, such as super feature detection, PIN mapping and guided feature analysis, helping engineers to quickly isolate and identify the cause of defects and quickly resolve the issue. Overall, KLA / TENCOR 7700 Surfscan is an invaluable tool for ensuring the accuracy and reliability of microelectronic devices. Its high precision motorized wafer stage and laser sensing machine provides accurate readings, while its advanced features help engineers to quickly detect and isolate defects.